2007年3月27日消息，NI（美國國家儀器有限公司）舉辦了每年一屆的第四屆自動化測試巔會，此次測試的特色是集中鑒別和克服新挑戰上。2007自動化測試巔會將于5月8日在網上實況轉播，持續90天。在免費一日行活動中，參加者可瀏覽主旨介紹，觀看技術會議、參與直播討論和在展區與賣主間的互動活動。 “NI每年都要與行業技術領先企業和ATE提供商共同主辦自動化測試巔會，向來自不同的電子技術領先制造商們的測試工程師和測試經理展示解決測試難題的最新測試策略和技術”NI自動化測試產品經理Kevin Bisking說，“為了使巔會讓工程師們容易掌握測試方法來面對增長的工作量，NI將在網上舉辦今年的測試巔會。工程師們可以根據方便自己的方法學到最優的測試方法” 來自公司的代表們，如微軟、英特爾、泰克（Tektronix）、Averna和BAE Systems將在活動舉行期間分享他們的專業技術和最優方法。NI業務和技術伙伴Mike Santori將參加主旨為“研發下一代測試系統”的測試。德州儀器自動化基礎設施經理Marvin Landrum，將參加下午的主旨為“發展全球測試程序戰略”。技術途徑包括下主題： 通過向普通測試系統架構轉移降低成本 通過下一代技術改良系統性能 發展全球化測試程序戰略 參考者可登錄https://events.unisfair.com/index.jsp?code=press&seid=4&eid=177.在線注冊 關于NI NI虛擬儀器領域的技術先驅和領導者。一個革新的觀念已經改變了工程師和科學家們在工業、政治和學術領域關于測量和自動化的模式。 NI總部位于德州Austin，擁有員工3,900多名分布在40多個國家。2005年，公司賣出的產品遍及90個國家的25,000公司。 original text [COLOR=#708090][b]National Instruments Hosts Automated Test Summit 2007 Industry-Leading Companies to Share Best Practices on Automated Test Design at Online Event[/b] NEWS RELEASE – March 27, 2007 – National Instruments is hosting the fourth annual Automated Test Summit, featuring technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet May 8, and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area. “National Instruments works with technology leaders and ATE suppliers every year to host the Automated Test Summit, which presents the latest test strategies and technologies addressing challenges faced by test engineers and senior managers from leading electronics manufacturers,” said Kevin Bisking, NI automated test product manager. “To make the summit more accessible to engineers facing increased workloads, NI is hosting the event online this year. Engineers will be able to learn the best practices in test development at their convenience.” Representatives from companies such as Microsoft, Intel, Tektronix, Averna and BAE Systems will share their technical expertise and best practices during the event. NI Business and Technology Fellow Mike Santori will present the keynote "Developing Next-Generation Test Systems." Marvin Landrum, automation infrastructure manager at Texas Instruments, will present the afternoon keynote “Strategies for Developing a Global Test Program.” Technical tracks feature the following topics: -Reducing cost by migrating to a common test system architecture -Improving system performance with next-generation technologies -Strategies for developing a global test program -Best practices for incorporating new measurements into a test system Participants can register online and find a full list of technical sessions at https://events.unisfair.com/index.jsp?code=press&seid=4&eid=177 [/COLOR]